Analysis

Overview

This page introduces sample programs for quality control and statistical analysis available on KEYENCE KV-X/KV series PLCs.
It explains how to implement on a PLC quality control techniques used in manufacturing, such as quality evaluation with the process capability index (Cpk) and process monitoring with X-bar R control charts.

List

Process Capability Index Cpk

Calculates the process capability index (Cpk) to evaluate the ability of product quality to stay within specification

X-bar R Control Chart

Creates an X-bar R control chart to detect process faults and quality variation early