NX/NJ Series Analysis Samples

This page introduces analysis samples that can be used on the OMRON NX/NJ series.
It includes statistical processing samples usable on the manufacturing floor, such as the process capability index (Cpk), Xbar-R control charts and histograms used in quality control, and predictive detection of equipment anomalies.

Samples

Process capability index Cpk

Calculates the process capability index (Cpk)

Xbar-R control chart

Calculates an Xbar-R control chart

Histogram

Collects analog data and creates histogram data

Alarm prediction

Measures the time taken by machine operations and predicts the number of operations until the alarm value is likely to be exceeded